electron-beam-induced-current technique

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• Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …   Wikipedia

• Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… …   Wikipedia

• Optical beam-induced currents — Optical Beam Induced Current (OBIC) is a semiconductor analysis technique that employs a scanning laser beam to induce a current flow within a semiconductor sample which may be collected and analyzed to generate images that represent the sample s …   Wikipedia

• Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

• Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

• Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

• Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …   Wikipedia

• Field electron emission — It is requested that a diagram or diagrams be included in this article to improve its quality. For more information, refer to discussion on this page and/or the listing at Wikipedia:Requested images. Field emission (FE) (also known as field… …   Wikipedia

• Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… …   Wikipedia

• Charge induced voltage alteration — (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis. Theory of operation The scanning of an electron beam across the… …   Wikipedia

• Charge Induced Voltage Alteration — (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis.Theory of operationThe scanning of an electron beam across the surface …   Wikipedia